The Abner fully automatic wafer transfer stage is a high-precision laboratory device specifically designed for precise and flexible sample handling. It features an imported XYZ three-axis translation stage and a high-precision electric rotation stage, ensuring accurate operation in a two-dimensional space. The rotation stage has an angular accuracy of 0.001 degrees, and the sample stage can be heated up to 400°C. Additionally, it is equipped with remote control functionality and a sample vacuum adsorption feature, greatly enhancing operational convenience and experimental efficiency.The equipment also includes a slide adsorption robotic arm, a metallographic microscope, a high-sensitivity CMOS microscope camera, and other high-end components, providing a wide range of applications and an excellent operational experience. Furthermore, the device comes with a 27-inch 2K full HD professional display and a high-performance computer, ensuring user comfort during operation and robust data pr

The Abner manual probe station is a precision electronic measurement device designed for high-precision testing needs. It includes a 6-inch sample stage (8-inch optional) equipped with vacuum adsorption and capable of 360° rotation, ensuring flexible multi-angle operation. The microscope section includes both stereoscopic and metallographic microscopes, supporting highly stable microscopic observation. Additionally, this probe station is equipped with a 12.7-megapixel high-quality Nikon CCD, providing users with clear image capture.The Abner manual probe station features a finely crafted design with 1-micron probe adjustment accuracy, and it comes with RF lines and various connector types to meet different testing requirements. It is compatible with various types of probes, such as GGB probes from the USA, imported probes from Korea, and domestic probes, ensuring a wide range of applications. The probe station also includes a high-performance vacuum pump and a 27-inch 2K full HD profes

The Abner confocal Raman microscope is a precision optical analysis instrument used for material analysis and chemical structure characterization. The confocal Raman microscopy method is a high-resolution Raman imaging technique with a half-step resolution of 2.5 microns, unidirectional positioning accuracy of ≤20 microns, and repeat positioning accuracy of ≤±1.5 microns. Its spectral resolution reaches up to 0.04 nm, and its wavelength accuracy is ±0.14 nm, ensuring the accuracy and reliability of experimental data. This technique does not require any labeling or special sample preparation techniques. Raman images can obtain information on the chemical compounds within the sample and their spatial distribution.

The Abner Atomic Force Microscope (AFM) maintains cutting-edge technology for nanoresearch, featuring atomic-level ultra-high resolution and high performance. It can probe or manipulate samples in both atmospheric and liquid environments. With powerful testing capabilities and user-friendly operation, it is equipped with standard imaging modes (contact mode, non-contact mode, tapping mode), and users can also select other modes as needed. Our system is professionally designed to perform various data analyses on the test results, making it more convenient and efficient to meet testing requirements.

Abner Technology is dedicated to the research and manufacture of vacuum coating equipment, with products covering thermal evaporation, magnetron sputtering, electron beam (e-beam), and PECVD. We provide solutions for the preparation of various thin films for research projects involving organic light-emitting diodes (OLEDs), organic photovoltaic cells (OPVs), quantum dots, and more.

Utilizes an infinity optical system to provide optimal optical performance.Compact and stable high-rigidity body, fully meeting the anti-vibration requirements for microscopic operations.Ergonomically designed for ease of operation and comfort, offering a spacious working area.Mechanical movable stage suitable for microscopic observation or rapid multi-sample inspection.Modular functional design allows for easy system upgrades to achieve dark field observation and other features.